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Patent Searching and Data


Title:
EXAMINATION APPARATUS FOR MICROPHONE DEVICE
Document Type and Number:
Japanese Patent JP2010041638
Kind Code:
A
Abstract:

To improve quality by enabling presence/absence of wire non-delivery between a MEMS chip GND and a substrate GND to be detected in 100% in a MEMS microphone and performing screening.

In order to detect presence/absence of non-delivery of a MEMS chip GND wire 7 in a MEMS microphone 2 installed in a contact socket 1, AC driven light is emitted from a high-output LED 3 and two factors are utilized where a microphone output level of an AC drive frequency is increased and a noise level is increased in the MEMS microphone under presence/absence of non-delivery of the MEMS chip GND wire 7, thereby enabling detection as a mass-product machine. Furthermore, since a method of the detection is similar to a conventional property examination, simultaneous examinations of property examination and wire examination are enabled by generating a three-wave mixed wave from a speaker 4 simultaneously with light emission.


Inventors:
NAKANONISHI YASUHIRO
Application Number:
JP2008205302A
Publication Date:
February 18, 2010
Filing Date:
August 08, 2008
Export Citation:
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Assignee:
PANASONIC CORP
International Classes:
H04R29/00; H04R19/04; H04R31/00
Attorney, Agent or Firm:
Shohei Oguri
Toshimitsu Ichikawa
Kimihide Hashimoto