Title:
Examination measuring equipment and the trigger method for the same
Document Type and Number:
Japanese Patent JP6059862
Kind Code:
B2
Inventors:
David El Kelly
Application Number:
JP2010289923A
Publication Date:
January 11, 2017
Filing Date:
December 27, 2010
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R13/20
Domestic Patent References:
JP2007327745A | ||||
JP2003344454A | ||||
JP2005062102A | ||||
JP2000321307A | ||||
JP62151763A | ||||
JP2000275276A | ||||
JP2009236765A |
Foreign References:
US20090281759 | ||||
US20050225310 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office
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