Title:
Examination measuring equipment and the trigger method
Document Type and Number:
Japanese Patent JP6067963
Kind Code:
B2
Abstract:
Embodiments of this invention provide enhanced triggering capabilities such as frequency and phase triggering in a test and measurement instrument, such as a Real-Time Spectrum Analyzer (RTSA) or oscilloscope. A test and measurement instrument can include input terminals to receive RF signals, an ADC to digitize the RF signals, a digital downconverter to produce I and Q baseband component information, and a power detector to determine a power level using the I and Q information. A comparator compares the power level received from the power detector with a user-definable power threshold, and produces a logic signal for enabling one or more phase or frequency demodulators. The one or more demodulators produce IQ-based time-domain traces derived from the I and Q component information when the power level determined by the power detector exceeds the power threshold. Trigger circuitry is configured to trigger on an event responsive to a delayed trigger enable signal.
Inventors:
Alfred Kay Hillman Jr.
Marcus Kay Da Silva
Catherine A. Engholm
Kenneth P. Dovins
Marcus Kay Da Silva
Catherine A. Engholm
Kenneth P. Dovins
Application Number:
JP2011169419A
Publication Date:
January 25, 2017
Filing Date:
August 02, 2011
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R23/16; G01R13/20; G01R23/173
Domestic Patent References:
| JP2005331300A | ||||
| JP2010505124A | ||||
| JP9119950A | ||||
| JP2007304060A | ||||
| JP2000004174A | ||||
| JP6342022A | ||||
| JP8322952A | ||||
| JP6034681A | ||||
| JP2009092660A |
Foreign References:
| WO2008062875A1 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office