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Patent Searching and Data


Title:
FEEBLE LIGHT ANALYSIS METHOD
Document Type and Number:
Japanese Patent JP2007155558
Kind Code:
A
Abstract:

To provide an analysis method capable of performing desired cell analysis even in the case of a feeble light sample, and an analysis method capable of analyzing a clear image in a short exposure time and in real time when an objective lens satisfies a specific condition.

In this method, a sample including a cell into which the first imperfect reporter gene expressibly connected to a promoter domain of a gene manifested by a specific cell and the second imperfect reporter gene expressively connected to a promoter domain of a gene whose manifestation is induced by stimulus generated by contact of some material with the cell are introduced is arranged within an imaging visual field, and stimulus is performed by bringing the material into contact with the sample. The method has an optical processing process wherein optical imaging of a detectable signal based on interaction between the first reporter gene and the second reporter gene manifested in the cell subjected to the stimulus is performed by an imaging means, to thereby determine quantitatively the amount of a signal generated by the reporter genes. An image enabling image analysis of the feeble light is generated in the optical processing process.


Inventors:
SUGIYAMA TAKASHI
Application Number:
JP2005352684A
Publication Date:
June 21, 2007
Filing Date:
December 06, 2005
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G01N33/58; C12N15/09; C12Q1/02; G01N21/76; G01N33/483