Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
微小粒子分析装置及び微小粒子分析方法
Document Type and Number:
Japanese Patent JP5886545
Kind Code:
B2
Abstract:
A minute particle analyzing device includes: a light source; a first condenser lens for condensing light from the light source to a first end of a multimode optical fiber; a second condenser lens for condensing the light emerging from a second end of the multimode optical fiber to a minute particle; and a detector for detecting light generated from the minute particle by the application of the light from the light source.

Inventors:
Koji Takasaki
Katsuhiro Seo
Sotoishi
Shinji Yamada
Atsushi Fukumoto
Gary Dulac
Application Number:
JP2011136986A
Publication Date:
March 16, 2016
Filing Date:
June 21, 2011
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ソニー株式会社
iCyt Mission Technology, Inc.
International Classes:
G01N15/14
Domestic Patent References:
JP1301146A
JP10301153A
JP2008294108A
JP2010169828A
JP2008216923A
JP2010156841A
Foreign References:
WO2009061710A1
Attorney, Agent or Firm:
Kaoru Watanabe