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Patent Searching and Data


Title:
FIXTURE FOR INSPECTING DISPLAY PANEL AND DISPLAY PANEL INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2009139391
Kind Code:
A
Abstract:

To provide a fixture for inspecting a thin display panel which achieves secure contact.

The fixture 1 for inspection includes a probe 20 for inspection, and a panel guide plate 10 having a positioning member 11 to position and guide a liquid crystal panel 3 to in a plane direction. The probe 20 for inspection has: a probe holding plate 21 hinge-connected to the panel guide plate 10 via a shaft member 121; a probe wiring member 22 having a plurality of bumps 221 protruding toward terminals of the liquid crystal panel 3; a membrane 23 interposed between the probe holding plate 21 and the probe wiring member 22; and a pressurizing member 24 mounted on a position different from those of the bump 221 and the membrane 23 in the plane direction of the liquid crystal panel 3 and pressurizing the probe holding plate 21 and the panel guide plate 10 to directions approaching each other, wherein openings are formed on positions of each of the probe holding plate 21 and the panel guide plate 10 corresponding to image regions of the liquid crystal panel 3.


Inventors:
NAKATANI TOSHIYUKI
YAMAGISHI HIDEKAZU
Application Number:
JP2007312156A
Publication Date:
June 25, 2009
Filing Date:
December 03, 2007
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G02F1/13; G01R31/00; G09F9/00
Domestic Patent References:
JPH047522A1992-01-10
JPH08254677A1996-10-01
JP2000241788A2000-09-08
JP2006322975A2006-11-30
JPH047522A1992-01-10
Attorney, Agent or Firm:
Intellectual Property Office