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Patent Searching and Data


Title:
FLAW DETECTION TEST METHOD AND PROBE
Document Type and Number:
Japanese Patent JPH0875714
Kind Code:
A
Abstract:

PURPOSE: To provide a flaw detection test method and a probe which facilitate the inspecting of a close contact part with other members even when a testing object in contact with the other members closely.

CONSTITUTION: A flexible vibrator 12 provided with electrodes 12b and 12c on both sides of a resin film 12a made of polyvinylidene fluoride is supported on a stainless tape 14 to form a probe 10. The probe 10 is inserted into a gap S formed at a close contact part of a support base 1 with respect to a testing object. Then, an ultrasonic wave P is transmitted to the testing object 2 from the vibrator 12 while being received, to perform an ultrasonic flaw detection. A spring 18a for contact is provided on the rear side of a detecting surface F to bring the detecting surface F into contact with a flaw detecting surface of the testing object 2 with the probe left inserted into the gap S. This prevents the lowering of the intensity of the transmitted or received wave as caused by excessive separation of the vibrator from the flaw detecting surface.


Inventors:
YOSHIARA TOSHIKATSU
IMANAKA TAKUICHI
Application Number:
JP23411094A
Publication Date:
March 22, 1996
Filing Date:
September 02, 1994
Export Citation:
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Assignee:
HIHAKAI KENSA KK
International Classes:
G01N29/24; H04R17/00; (IPC1-7): G01N29/24; H04R17/00
Attorney, Agent or Firm:
Koji Kitamura