Title:
定置式洗浄システムをモニタリングする蛍光分析的方法
Document Type and Number:
Japanese Patent JP4808775
Kind Code:
B2
Abstract:
The invention pertains to a method for fluorometrically monitoring a Clean-In-Place ("CIP") system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chemical or both, which are added to the CIP system.
Inventors:
Van Camp, James, Earl.
Foots, John
Hotslander, John
Foots, John
Hotslander, John
Application Number:
JP2008517199A
Publication Date:
November 02, 2011
Filing Date:
June 19, 2006
Export Citation:
Assignee:
NALCO COMPANY
International Classes:
B08B3/08; G01N21/64
Domestic Patent References:
| JPH08243520A | 1996-09-24 | |||
| JPH08299923A | 1996-11-19 | |||
| JPH0853301A | 1996-02-27 | |||
| JPH08502359A | 1996-03-12 |
Attorney, Agent or Firm:
Patent Corporation yki International Patent Office