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Title:
FORMATION OF ELECTRODE CONNECTING HOLE IN SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPH0377321
Kind Code:
A
Abstract:

PURPOSE: To make a coverage of an electrode interconnection layer good in a part of an electrode connecting hole and to reduce a danger of a disconnection and the like in the part by a method wherein a recessed part which is larger than the electrode connecting hole to be formed is formed in a definite depth on an insulating film by a photolithographic operation and, after that, the electrode connecting hole is formed in a position where the recessed part has been formed by executing the photolithographic operation again.

CONSTITUTION: A patterning operation of an electrode connecting hole is executed by using a photomask having an opening pattern which is larger than the electrode connecting hole to be formed. By adopting an RIE operation, an insulating film 2 is etched down to a definite depth from its surface to form a recessed part 3. Then, the BPSG film 2 in which the recessed part has been formed is annealed in a steam atmosphere; side faces of the vertically steep recessed part 3 are made to reflow; a gentle curve-shaped recessed part 4 is formed. By a second photolithographic operation, an electrode connecting hole 5 which has pierced the insulating film 2 is formed in the recessed part 4.


Inventors:
TABUCHI YOSHIHIRO
Application Number:
JP21381889A
Publication Date:
April 02, 1991
Filing Date:
August 19, 1989
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
H01L21/3205; (IPC1-7): H01L21/3205
Domestic Patent References:
JPS5698832A1981-08-08
JPS6432651A1989-02-02
Attorney, Agent or Firm:
Iwao Yamaguchi



 
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