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Patent Searching and Data


Title:
FORMATION OF PATTERN
Document Type and Number:
Japanese Patent JPS6032048
Kind Code:
A
Abstract:

PURPOSE: To form a pattern high in resolution with high sensitivity by forming on a substrate a thin film a polymer having in the molecule, chalkone groups each substd. by an electron donor group as a photosensitive group, selectively irradiating UV rays, and then, eluting the unexposed parts with a developing soln. to develop it.

CONSTITUTION: A methyl or methoxy group is introduced into each chalkone group of a chalkone type polymer, embodied by a copolymer of 4'-methacryloylchalkone or 4-methacryloylchalkone, and methacrylate, such as methyl methacrylate, butyl methacrylate, or glycidyl methacrylate, and such introduction can shift its photosensitivity to a long wavelength side. For example, a substrate is coated with a resist of a copolymer of glycidyl methacrylate, and prebaked in the air, the desired parts of the resist film are irradiated with 365nm UV ray, and then developed. A necessary 365nm ray irradiation time is shortened to 1/3W 1/6 as short as that of the conventional chalkone type resists and a pattern high in resolution can be obtained.


Inventors:
TAKEYAMA KENICHI
SASAGO MASARU
Application Number:
JP14133683A
Publication Date:
February 19, 1985
Filing Date:
August 01, 1983
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G03F7/26; G03C1/00; G03C5/00; G03F7/038; G03F7/32; H01L21/027; (IPC1-7): G03C1/00; G03F7/00; H01L21/30
Attorney, Agent or Firm:
Akira Kobiji (2 outside)