Title:
GROUND ESTIMATION METHOD
Document Type and Number:
Japanese Patent JP2017193841
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To increase estimation accuracy of a ground characteristic.SOLUTION: There is provided a ground estimation method for estimating a dominant frequency of a ground having a hard bedrock below a ground surface. The ground estimation method includes: a microtremor measurement step of measuring a microtremor in a horizontal x-direction, a microtremor in a horizontal y-direction orthogonal to the horizontal x-direction, and a microtremor in a vertical direction, at a plurality of angular positions obtained by rotating the horizontal x-direction and the horizontal y-direction on a horizontal plane; a spectrum calculation step of calculating a spectrum Hx, a spectrum Hy, and a spectrum V for each of the plurality of angular positions, based on the microtremor in the horizontal x-direction, the microtremor in the horizontal y-direction, and the microtremor in the vertical direction; and a dominant frequency estimation step of obtaining the angular position with a most closely resembling form based on the spectrum Hx and the spectrum Hy, or a Hx/V spectrum ratio or a Hy/V spectrum ratio at each angular position, and then estimating the dominant frequency of the ground based on the spectrum Hx, the spectrum Hy, and the spectrum V at the obtained angular position.SELECTED DRAWING: Figure 7
Inventors:
HAGIWARA YOSHINORI
Application Number:
JP2016083362A
Publication Date:
October 26, 2017
Filing Date:
April 19, 2016
Export Citation:
Assignee:
OHBAYASHI CORP
International Classes:
E02D1/00; G01V1/00
Domestic Patent References:
JP2001193046A | 2001-07-17 | |||
JP2005344309A | 2005-12-15 | |||
JPS6319583A | 1988-01-27 | |||
JPH0412291A | 1992-01-16 | |||
JP2001021665A | 2001-01-26 | |||
JPH10319128A | 1998-12-04 | |||
JP2006349491A | 2006-12-28 |
Foreign References:
US20050143924A1 | 2005-06-30 | |||
US20080175101A1 | 2008-07-24 |
Attorney, Agent or Firm:
Isshiki International Patent Service Corporation
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