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Patent Searching and Data


Title:
FREQUENCY TEST CIRCUIT
Document Type and Number:
Japanese Patent JP2014085344
Kind Code:
A
Abstract:

To provide a frequency test circuit.

A frequency test circuit is used for testing a first clock signal having the first clock frequency of a server, and the frequency test circuit includes a first counting unit and a first control unit which operates under a second clock signal having a second clock frequency. The first control unit outputs a first control signal and a second control signal corresponding to the first counting unit on the basis of the second clock signal, and the first counting unit receives a first clock signal, and counts the number of pulses of the first clock signal under the control of the first control signal, and stops counting under the control of the second control signal to obtain a counting result, therein the counting result is the first clock frequency.


Inventors:
PANG WEI
Application Number:
JP2013216146A
Publication Date:
May 12, 2014
Filing Date:
October 17, 2013
Export Citation:
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Assignee:
KOFUKIN SEIMITSU KOGYO
HON HAI PREC IND CO LTD
International Classes:
G01R23/02; H03K19/00
Attorney, Agent or Firm:
Yasuhiko Murayama
Masatake Shiga
Takashi Watanabe
Shinya Mitsuhiro