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Title:
ガス分析方法及びガス分析装置
Document Type and Number:
Japanese Patent JP7401768
Kind Code:
B2
Abstract:
To achieve stable calculation and reduce a calculation cost in CT image reconstruction algorithm of CT-TDLAS.SOLUTION: A gas analysis method includes a first step of discretely estimating estimated values of temperature and concentration of measurement object gas in an internal space of a measurement chamber including the measurement object gas within a range of 500°C to 2000°C inside the measurement chamber, a second step of performing space interpolation of the estimated values discretely estimated in the first step by third- or less-degree polynomial interpolation, a third step of performing repetitive optimization calculation of correcting the estimated values so that an error between laser beam intensity calculated by the estimated values in the first step and a measured value of the laser beam intensity is mimized, and a fourth step of increasing, in a stepwise manner, the number points in a space of the estimated values corrected in the third step and calculating a spatial distribution of the temperature and concentration of the measurement object gas.SELECTED DRAWING: Figure 2

Inventors:
Akihiro Sakamoto
Shota Sugawara
Application Number:
JP2020056417A
Publication Date:
December 20, 2023
Filing Date:
March 26, 2020
Export Citation:
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Assignee:
Nippon Steel Corporation
International Classes:
G01N21/3504; F27D21/00
Domestic Patent References:
JP8044863A
JP2006350562A
JP2015040747A
JP2016186464A
JP2005287750A
Foreign References:
WO2017119283A1
Other References:
CT半導体レーザ吸収法を用いた高温域における2次元温度分布計測の特性評価,自動車技術会論文集,2014年11月,Vol.45, No6,971-976
Attorney, Agent or Firm:
Tetsuo Kanemoto
Koji Hagiwara
Naoki Ogita
Takashi Saito
Takuya Mine