To provide a method and a system capable of easily and accurately finding geometrical transformation, which is performed to an image, at high speed without using any source image.

The summary of a geometrical correction system based on the embedding of a two-dimensional(2D) wave pattern is composed of preparation 110 of a pattern consisting of 2D waves having no symmetry axis, embedding 130 in the rear space of a pattern consisting of 2D waves, and calculation 160 of a geometrical transformation performed based on the extraction of embedded 2D waves. The preparation 110 of pattern consisting of 2D waves is to calculate a 2D wave parameter set for preparing the pattern suitable for this geometrical correction system. The embedding 130 in the rear space of patter composed of 2D waves is to add the pattern composed of 2D waves to the source image. The calculation 160 of geometrical transformation performed based on the extraction of embedded 2D waves is to calculate the parameters of embedded 2D waves from the image, to which the geometrical transformation is performed, and to find the geometrical transformation performed to the embedded image by comparing the parameters with the 2D wave parameter set of the embedded pattern.