Title:
GRAIN INSPECTION DEVICE AND CULTIVATION MANAGEMENT SYSTEM USING THE SAME
Document Type and Number:
Japanese Patent JP2022015784
Kind Code:
A
Abstract:
To provide a grain inspection device capable of performing quality inspection by selecting a defective from grains, while effectively using quality measurement for the grains, and a cultivation management system that effectively uses data of the grain inspection device to serve cultivation management of rice plant in the next fiscal year for farmers.SOLUTION: A grain inspection device includes optical detection means for detecting an object to be inspected falling from a lower end of a chute, ejector means for selecting and eliminating the object to be inspected on the basis of the detection result by the optical detection means, and a discharge hopper that discharges the object to be inspected selected by the ejector means. The device is applied with technical means including first calculation means for selecting and determining the object to be inspected into a non-defective or a defective on the basis of an image signal of the optical detection means, second calculation means for measuring a mixture degree of a defective factor, and communication means for transmitting the measurement result by the second calculation means or the like to a server.SELECTED DRAWING: Figure 1
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Inventors:
IKEDA NOBUYOSHI
HARA MASAZUMI
HARA MASAZUMI
Application Number:
JP2020118868A
Publication Date:
January 21, 2022
Filing Date:
July 10, 2020
Export Citation:
Assignee:
SATAKE ENG CO LTD
International Classes:
B02B7/00; G01N21/85