Title:
地盤試料のスキャン方法、地盤試料の供試体の生産方法、地盤試料の土質試験方法及び地盤試料のスキャン装置
Document Type and Number:
Japanese Patent JP6936451
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a scanning method of ground samples, a method of producing test samples of ground samples, a soil test method of ground samples and a scanning apparatus of ground samples, capable of preventing inadvertent disturbance and the like due to the handling of the ground sample by scanning the ground sample at an original position and X-ray imaging of long ground samples.SOLUTION: Included are a sampler penetration step 5 for penetrating a sampler into the ground, and a scan process 7 for acquiring scan data of a long ground sample from the X-ray photograph of the ground sample formed by penetrating the sampler in the ground or in the vicinity of the ground, which is taken by an imaging device provided either in the sampler or above the sampler.SELECTED DRAWING: Figure 1
Inventors:
Matsumura Satoshi
Mizutani Sosuke
Eiji Obama
Akihiko Kondo
Yukio Sakai
King wave
Norio Saito
Shuichi Suzuki
Liu Small Army
Mizutani Sosuke
Eiji Obama
Akihiko Kondo
Yukio Sakai
King wave
Norio Saito
Shuichi Suzuki
Liu Small Army
Application Number:
JP2017089168A
Publication Date:
September 15, 2021
Filing Date:
April 28, 2017
Export Citation:
Assignee:
National Research and Development Agency Maritime, Port and Aeronautical Technology Research Institute
Foundation Ground Consultants Co., Ltd.
Tsukuba Technology Co., Ltd.
Foundation Ground Consultants Co., Ltd.
Tsukuba Technology Co., Ltd.
International Classes:
G01N23/046; E02D1/04
Domestic Patent References:
| JP2012154627A | ||||
| JP2010189838A |
Foreign References:
| US20150337654 | ||||
| WO2016146989A1 | ||||
| US20170008085 | ||||
| US20170089158 | ||||
| US4710948 |
Other References:
松村聡,マイクロフォーカスX線CTスキャナを用いた地盤工学への新たなアプローチ,港湾空港技術研究所資料,2015年12月,pp.1-18
Attorney, Agent or Firm:
Mitsuyasu Miura
Takayuki Kayahara
Takayuki Kayahara