To highly accurately align a test pad and a measuring pin.

In this handier for a TCP, a belt-like TCP tape X formed by linking plural TCP's 1 is sent successively intermittently, and simultaneously test pads 1b of each TCP 1 are connected respectively in contact with the measuring pin 9 of a semiconductor integrated circuit testing device. The handler is equipped with a transfer means for sending the TCP tape X successively intermittently in the longitudinal direction so that each TCP 1 is stopped on the position opposite to the measuring pin 9, a pressing means for pressing the TCP 1 in the state where the TCP tape is stopped, to bring the test pad 1b into contact with the measuring pin 9, an imaging means 10 fixed and arranged on a prescribed position, for imaging each TCP 1, and a position adjusting means for adjusting the position of the TCP 1 so that a photographed image G1 by the imaging means 10 agrees with a reference image G2 for showing the standard position of the TCP 1 to the measuring pin 9.