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Title:
HETERO EPITAXIAL GROWTH METHOD
Document Type and Number:
Japanese Patent JPS63136511
Kind Code:
A
Abstract:

PURPOSE: To prevent a crystalline film from being warped and cracked by inclining the crystal face of a different kind of single crystalline film corresponding to the same face orientation as that of the growth face of a single crystalline substrate with respect to the growth face.

CONSTITUTION: When a single crystalline grown film B of lattice constant (b) is epitaxially grown on a single crystalline substrate A of lattice constant (a), the crystal face orientation of the film B is inclined with respect to the substrate A thereby to reduce a distance between crystal lattices parallel to a boundary of the film B with respect to the lattice constant (a) of the substrate A smaller than the lattice constant (b) at a hetero junction boundary C to substantially largely reduce the degree of a lattice distortion. For example, when the Si single crystalline substrate surface is carbonized by a chemical vapor growth method to form a thin layer of SiC single crystal and an SiC single crystal film is epitaxially grown on the thin layer of SiC, the crystal face orientation 511 of the obtained grown film inclines 3.7 degrees with respect to the face orientation 511 of the substrate surface. Thus is can prevent the grown film from being warped and cracked.


Inventors:
SUZUKI AKIRA
SHIGETA MITSUHIRO
FURUKAWA MASAKI
FUJII YOSHIHISA
HATANO AKITSUGU
NAKANISHI KENJI
UEMOTO ATSUKO
Application Number:
JP28498286A
Publication Date:
June 08, 1988
Filing Date:
November 27, 1986
Export Citation:
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Assignee:
SHARP KK
International Classes:
H01L21/20; H01L21/205; (IPC1-7): H01L21/20; H01L21/205
Attorney, Agent or Firm:
Sugiyama Takeshi



 
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