To provide a technology for detecting the presence of hexavalent chromium in a sample with good accuracy.
The sample 1 and an organic acid solution 2 containing a reagent interacting with hexavalent chromium are brought into contact with each other for a predetermined time. The organic acid solution 2 is placed on the surface of a measurement substrate 6. Subsequently, the organic acid solution 2 is dried. After that, the surface of the evaluation substrate 6 is analyzed to determine the presence of hexavalent chromium in the sample 1. When the hexavalent chromium is contained in the sample 1, a reactant 4 of the hexavalent chromium and the sample exists on the surface of the measurement substrate 6 after the organic acid solution 2 is dried. Therefore, the reactant 4 can be analyzed by analyzing the surface of the measurement substrate 6. Thus, the presence of hexavalent chromium in the sample can be detected with high accuracy by analyzing the reactant 4 of the hexavalent chromium and the sample.
COPYRIGHT: (C)2008,JPO&INPIT
Yoshitake Hidetoshi
Takahiro Arita
Next Patent: METHOD AND DEVICE FOR MULTIPLE POINT MEASUREMENT OF PERPENDICULARITY