To provide a light signal waveform measuring device for measuring the waveform of a high frequency light signal with a very short wavelength with minimized waveform distortion.
The high frequency light signal measuring device has a photodetector 110 converting high frequency incident light signal to be measured, a photoconductive switch 120 receiving light pulse signals, an electrode 131 connecting the photodetector 120 and the photoconductive switch 110, samples a high frequency electric signal by introduced light pulse signals and provides output signals. The electrode 131 is constituted not causing mutual interference between the high frequency light signal to be measured and the light pulse signals, and constituted by shortening the dimension so as to be shorter than that causing waveform distortion in the output signal due to refelection wave in the electrode 131.
YAMADA NORIHIDE
KANEKO YASUHISA
Next Patent: GASIFICATION FURNACE PROVIDED WITH TEMPERATURE MEASURING DEVICE