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Title:
穴内部検査装置
Document Type and Number:
Japanese Patent JP7205832
Kind Code:
B2
Abstract:
To provide a hole interior inspection device which has a curved inner peripheral surface, can facilitate discrimination of a type of a scratch on a hole of an inspection object and can reduce the detection time and cost.SOLUTION: A hole interior inspection device 10 comprises: a stay 41 which is inserted to a hole 82 of an inspection object 80; and a light source unit 40 in which a plurality of color light sources 42, 43, 44 having mutually different colors are fixedly arranged along the insertion direction to the inspection object 80 with respect to the tip side of the stay 41. The hole interior inspection device 10 comprises: a wide angle lens 32 which is attached to a base end side with respect to the light source unit 40 in the stay 41 and is located at a position capable of receiving reflection light formed with the mirror reflection of the projection light of the light source unit 40 on the inner peripheral surface of the hole 82 of the inspection object 80; and an imaging unit 30 which acquires a photographed image including a region to which the colors of the color light sources 42, 43, 44 are applied. The hole interior inspection device 10 comprises a scratch type discrimination unit 63 which inputs the photographed image output from the imaging unit 30.SELECTED DRAWING: Figure 2

Inventors:
Teruhisa Yotsuya
Yokota Yasunari
Kazuyuki Zeno
Daisuke Kondo
Application Number:
JP2020001544A
Publication Date:
January 17, 2023
Filing Date:
January 08, 2020
Export Citation:
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Assignee:
Tokai National University Organization
Mitsutech Co., Ltd.
International Classes:
G01N21/954; G01B11/00; G01B11/30
Domestic Patent References:
JP2017053790A
JP2014191242A
JP54146284U
Attorney, Agent or Firm:
Makoto Onda
Hironobu Onda