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Title:
食品バッチの微生物学的リスクレベルを決定する方法
Document Type and Number:
Japanese Patent JP7262457
Kind Code:
B2
Abstract:
A method of determining a microbiological risk level in food, comprising determining zero-inflated binomial (ZIB) distribution parameters (À, p); i) determining cumulative relative frequencies (f 0 , f 1 , f 2 ,.., f x ) for a number of occurrences (0, 1, 2, ..., x) of defective samples; ii) calculating a vector of a sub-set of zero-inflation parameters ( À ) of k+1 elements according to; À = [0, 1*f 0 /k, 2*f 0 /k, ..., k*f 0 /k]; iii) calculating a vector of a sub-set of first parameters ( p ) based on the sub-set of zero-inflation parameter ( À ); iv) for the vector pairs ( p , À ) in the sub-set of first parameters and the sub-set of zero-inflation parameters, determining a square error between said cumulative relative frequencies and cumulative theoretical probabilities P x of having ‰¤ x occurrences over N samples for a ZIB distribution; v) determining the zero-inflation parameter (À) and the first parameter (p) as the vector pair providing the least square error.

Inventors:
Luca Pickikkut
Pietro Tarantino
Application Number:
JP2020524827A
Publication Date:
April 21, 2023
Filing Date:
October 23, 2018
Export Citation:
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Assignee:
Tetra Laval Holdings and Finance SA
International Classes:
G01N33/02; C12Q1/04; G06Q10/04
Domestic Patent References:
JP2014207005A
JP2008131927A
JP2015514356A
JP2015144581A
JP2007120998A
JP2004008078A
Foreign References:
WO2017152137A2
Attorney, Agent or Firm:
Yoshinobu Idokawa