Title:
有機機能装置内での短絡不具合の発生を抑制する方法
Document Type and Number:
Japanese Patent JP2008545232
Kind Code:
A
Abstract:
A method, for reducing occurrence of short-circuit failure in an organic functional device (101, 201, 401) comprising a first transparent electrode layer (104), a second electrode layer (105) and an organic functional layer (103) sandwiched between said first and second electrode layers (104; 105). The method comprises the steps of identifying (301) a portion of said organic functional device (101, 201, 401), said portion containing a defect (102a-g) leading to an increased risk of short-circuit failure, selecting (302) a segment (108a-g) of said second electrode layer (105), said segment corresponding to said portion, and electrically isolating (303) said segment (108a-g) from a remainder of said second electrode layer (105), thereby eliminating short-circuit failure resulting from said defect (102a-g).
Inventors:
Büchel, Michael
Edward, Edward Weir
Sempel, Adrianis
Boulefane, Iffar Ye
Edward, Edward Weir
Sempel, Adrianis
Boulefane, Iffar Ye
Application Number:
JP2008519065A
Publication Date:
December 11, 2008
Filing Date:
June 27, 2006
Export Citation:
Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
H05B33/10; H01L33/00; H01L33/26; H01L33/42; H01L51/42; H01L51/50
Attorney, Agent or Firm:
Tadahiko Ito
Shinsuke Onuki
Tadashige Ito
Koichi Matsumoto
Shinsuke Onuki
Tadashige Ito
Koichi Matsumoto