【発明の名称】円盤状情報記録媒体の欠陥検査装置

Japanese Patent JP2531293

B2

PURPOSE:To necessitate one time of the reproduction for the puprose of detecting defects by combining and handling the discretely detected defects of one bit to a defect lump in accordance with the position information thereof, detecting the kinds of the defects or defect lump and storing the information of the kinds, positions and sizes of the defects and defect lumps. CONSTITUTION:This device has a section 3 for detecting the information on defect sizes, a section 5 for detecting control track errors, a section 6 for detecting the generation of an address decoding gate signal and a header error, a section 7 for detecting the kind of the defects, a section 9 for detecting the information on the track position, a section 10 for detecting the information on the angle and sector position, and a memory 11. The defects are detected by the reproduction signal obtd. by reproducing the information recording medium to be inspected by a reproducing device 2. The kind, diametral position and circumferential position thereof are detected simultaneously therewith. The defects approaching in accordance with the detection positions thereof are combined as the defect lump and the sizes in the diametral and circumferential directions thereof are calculated. Further, the kinds, positions and sizes of these defects and defect lump are stored. The inspection by using a microscope is executed by using these stored contents. The inspection of the defects by one time of reproduction is enabled in this way.

SHIMOTE JUJI
FUKUDA MITSUO
OTOTAKE MASABUMI
SHINDO KOJI

JP10203190A

September 04, 1996

April 17, 1990

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MITSUBISHI ELECTRIC CORP

G11B7/26; G01R33/12; G11B5/84; G11B7/0037; G11B11/10; G11B11/105; G11B20/18; G11B27/36; (IPC1-7): G11B7/26; G11B5/84; G11B11/10; G11B20/18

Kaneo Miyata (3 outside)

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