【発明の名称】分光光度計の目盛づけ装置及び方法

Japanese Patent JP3215118

B2

A spectrophotometer apparatus (200) is adapted to provide spectral reflectance measurements of object samples. The apparatus (200) comprises a source light (254) and a reflection optics assembly (264, 268). Signals representative of reflected light are analyzed and data provided to an operator representative of the spectral response characteristics of the object sample (252). The apparatus (200) further comprises a side sensor (276) having a fixed spectral response characteristic for compensating the reflectance measurements in accordance with the light intensity emanating from the lamp. For purposes of calibration, a series of time-sequenced measurements are made of a reference sample. Utilizing these measurements, the apparatus (200) provides computations of compensation coefficients for each spectral segment. The compensation coefficients are utilized, with the side sensor measurements, to provide normalization of the reflectance measurements for each segment and for each measurement within the timed sequence. For each segment, a scale factor is then determined. The scale factors, compensation coefficients and side sensor measurements are employed to compensate actual reflectance measurements, with further compensation provided by a determination of temperature coefficients.

Mark, A, Cargill
Bernard, Jay, Burg

JP5976291A

October 02, 2001

March 01, 1991

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X-RITE,INCORPORATED

G01J3/02; G01J3/51; G01N21/27; G01N21/47; G01J1/02; G01J1/16; G01J1/42; G01J3/28; (IPC1-7): G01J3/51

JP63249027A
JP227227A
JP6070319A
JP6121937U

Mitsuteru Soga (7 outside)

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