To test an IC without any trouble even when the direction of an IC socket of a testing device does not agree with the direction of the terminal of a supplied IC by changing the arranging direction of the terminal of an IC by an IC rotation means in a loader part and moving the IC rotation means in the up and down direction.

When an IC is inserted, IC rotating means 11, 12 rotate IC mounting parts 11A, 11B and 12A, 12B to an arbitrary angle, respectively. When the IC is rotated to an aiming direction, the IC rotating means 11, 12 slightly move the IC mounting parts 11A, 11B and 12A, 12B to make carrier arms 3, 10 suck the IC mounted on the IC mounting parts 11A, 11B and 12A, 12B. The carrier arm 3 carries the IC from the IC mounting parts 11A, 11B to a positioning recessed part 5 on a turn table 4 and a carrier arm 10 carries the IC from the IC mounting parts 12A, 12B to any of tray groups 2C, 2D, 2E.