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Title:
IC SOCKET FOR TEST
Document Type and Number:
Japanese Patent JPH11233216
Kind Code:
A
Abstract:

To provide a test IC socket of a BGA(ball grid array) package enabling to surely prevent pulling-out and slippage of terminals even when press- fitting force of terminal fixing parts gets beaten by force of springs of pin socket contacting parts.

Terminal terminal fixing parts 1c of terminals 1 composed of a contacting part 1a, a spring part 1b, a terminal terminal fixing part 1c and a terminal terminal lead 1d are inserted and fixed into first fixing holes 3 formed in a bottom part 2a of an IC socket body 2. Then, the terminals 1 are inserted into second fixing holes 9 provided in a fixing plate 4, and the plate 4 is put on the upper surface of the bottom part 2a of the IC socket body 2. Thus, the terminal terminal fixing parts 1c are pressed from above by peripheral parts of the second fixing holes 9.


Inventors:
MORI YOICHI
AOKI YOSHIHIRO
Application Number:
JP3273598A
Publication Date:
August 27, 1999
Filing Date:
February 16, 1998
Export Citation:
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Assignee:
NIPPON DENKI FACTORY ENGINEERI
NEC CORP
International Classes:
G01R31/26; G01R1/04; H01L21/66; H01L23/32; H01R33/76; H01R33/94; (IPC1-7): H01R33/76; G01R31/26; H01L21/66; H01L23/32; H01R33/94
Attorney, Agent or Firm:
Naoki Kyomoto (2 outside)



 
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