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Patent Searching and Data


Title:
IC TEST EQUIPMENT
Document Type and Number:
Japanese Patent JPS5535234
Kind Code:
A
Abstract:

PURPOSE: To make it possible to test a lateral coincidence system and longitudinal coincidence system by the same equipment by providing and controlling a control file.

CONSTITUTION: Bottle assignment data is stored in register 28 and instruction FLGS indicating a coincidence detection test is in command part 26 of a control file; in case of a dissidence, the same pattern is supplied to tested IC until a coincidence is detected. As for a longitudinal coincidence detection test, instruction FLGS indicating coincidence detection is stored in corresponding command part 26 at an address corresponding to its longitudinal input pattern and in its operand part 27, the initial address of the longitudinal coincidence test, for example, is stored, so that the longitudinal coincidence test will automatically be made. In this way, the lateral and longitudinal coincidence systems can be tested by the same unit.


Inventors:
NISHIURA JIYUNJI
Application Number:
JP10825778A
Publication Date:
March 12, 1980
Filing Date:
September 04, 1978
Export Citation:
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Assignee:
TAKEDA RIKEN IND CO LTD
International Classes:
G01R31/26; G01R31/3183; G01R31/28; G01R31/319; (IPC1-7): G01R31/26