PURPOSE: To make it possible to test a lateral coincidence system and longitudinal coincidence system by the same equipment by providing and controlling a control file.
CONSTITUTION: Bottle assignment data is stored in register 28 and instruction FLGS indicating a coincidence detection test is in command part 26 of a control file; in case of a dissidence, the same pattern is supplied to tested IC until a coincidence is detected. As for a longitudinal coincidence detection test, instruction FLGS indicating coincidence detection is stored in corresponding command part 26 at an address corresponding to its longitudinal input pattern and in its operand part 27, the initial address of the longitudinal coincidence test, for example, is stored, so that the longitudinal coincidence test will automatically be made. In this way, the lateral and longitudinal coincidence systems can be tested by the same unit.
JP2772086 | [Title of Invention] Semiconductor test apparatus |
JPH11344527 | MEASURING MECHANISM OF HOT HANDLER |
JPH10267988 | SEMICONDUCTOR TESTER |
Next Patent: METHOD AND PRINTED-WIRING PLATE FOR MEASURING OPERATING WAVEFORM OF PRINTED-WIRING PLATE AFTER WIRIN...