IMAGE DIAGNOSTIC DEVICE AND ITS EXAMINATION TIME SHORTENING SCAN CONDITION SETTING METHOD

Title:

IMAGE DIAGNOSTIC DEVICE AND ITS EXAMINATION TIME SHORTENING SCAN CONDITION SETTING METHOD

Document Type and Number:

Japanese Patent JP3466652

Kind Code:

B2

Abstract:

PURPOSE: To provide such a scan control method as a usual advance of an examination is suspended and the examination of a patient can be finished in the shortest time, at the time of emergency, in the image diagnostic device.
CONSTITUTION: When it is instructed to select an examination time shortening scan mode by a selection switch, it is instructed to interrupt a usual examination at its point of time from an examination time shortening scan mode instructing part 11 to a scan control part 13, and simultaneously, it is instructed to generate the shortest scan condition in an examination condition to a shortest scan condition generating part 12. The scan control part 13 which obtains the interrupting instruction interrupts a scan by controlling a bed control part 14 and an X-ray control part 15. The shortest scan condition generating part 12 generates automatically the shortest scan condition. Subsequently, the scan control part 13 restarts and executes the scan by controlling the bed control part 4 and the X-ray control part 15, based on the generated shortest scan condition, after generation of the shortest scan condition by the shortest scan condition generating part 12 is completed.

Inventors:

Masahiro Ozaki
Nobukatsu Soejima

Application Number:

JP6641193A

Publication Date:

November 17, 2003

Filing Date:

March 25, 1993

Export Citation:

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