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Title:
IMAGE INSPECTION APPARATUS, IMAGE PROCESSING SYSTEM, AND IMAGE INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2014055852
Kind Code:
A
Abstract:

To provide an image processing device having a plurality of image processing functions, configured to inspect an image by comparing an image formed by reading a result of image formation output with a master image.

An inspection apparatus 2 for inspecting a read image formed by reading an image formed and output on a sheet by an MFP 1 having a plurality of image processing functions includes: a master image processing part 202 which acquires bitmap data converted in the MFP 1 to generate a master image to be used for inspecting the read image; an inspection control part 205 that determines a defect of the read image on the basis of a difference between the master image and the read image; and a comparison inspection part 206. The master image processing part 202 generates a master image by performing image processing according to an information format of the acquired bitmap data.


Inventors:
ISHIZAKI HIROMI
Application Number:
JP2012200781A
Publication Date:
March 27, 2014
Filing Date:
September 12, 2012
Export Citation:
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Assignee:
RICOH CO LTD
International Classes:
G01N21/892; G06T1/00
Domestic Patent References:
JP2009126058A2009-06-11
JP2012168166A2012-09-06
JP2011146033A2011-07-28
JP2008014703A2008-01-24
JP2012103225A2012-05-31
JP2009126058A2009-06-11
Attorney, Agent or Firm:
Takashi Satoru
Akinari Tachibana