Title:
IMAGE INSPECTION DEVICE, METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2023014650
Kind Code:
A
Abstract:
To improve the accuracy of detecting defects while maintaining productivity.SOLUTION: A parameter setting unit 203 calculates a concentration difference value on the basis of a detected concentration value derived by measuring a chart image and updates the history information of latest concentration difference values on the basis of the concentration difference value. When it is determined that all of the values of history information are not a standard value or below, the parameter setting unit 203 determines that concentration stability is not high and sets a first determination threshold Th_high as a determination threshold TH; when it is determined that all of the values of the history information are a standard value or below, the parameter setting unit 203 determines that concentration stability is high and sets a second determination threshold Th_low which is lower than the first determination threshold Th_high as the determination threshold TH. An image acquisition unit 201 acquires a reference image and an inspection object image. A detection processing unit 204 inspects the inspection object image from an image derived by binary processing of a difference image between the reference image and inspection object image in accordance with the determination threshold TH.SELECTED DRAWING: Figure 6
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Inventors:
OYA MASASHI
Application Number:
JP2021118718A
Publication Date:
January 31, 2023
Filing Date:
July 19, 2021
Export Citation:
Assignee:
CANON KK
International Classes:
G01N21/892; B41J2/01; B41J29/393; G03G21/00
Attorney, Agent or Firm:
Another role