Title:
IMAGE PICKUP DEVICE
Document Type and Number:
Japanese Patent JPH09146011
Kind Code:
A
Abstract:
To enable electric inspection at any time even during assembling operation.
A test pad part 7 for inspecting electric characteristics is provided at one end part of a flexible circuit board in a thin and long plate shape. After a charge coupled device(CCD) 1, an integrated circuit(IC) 3, and a compound multicore cable 8 are connected to the FPC 4, the FPC 4 is bending- worked and its necessary parts are fixed with an adhesive and then the test pad part 7 projecting from the image pickup device 31 is cut away from a cut line 12. Consequently, the electric inspection can be done at any time even during the assembling operation by using the test pad part 7.
Inventors:
ISHII HIROSHI
Application Number:
JP29974795A
Publication Date:
June 06, 1997
Filing Date:
November 17, 1995
Export Citation:
Assignee:
OLYMPUS OPTICAL CO
International Classes:
G02B23/24; A61B1/04; H04N5/225; H04N5/335; H04N5/357; H04N5/372; (IPC1-7): G02B23/24; A61B1/04; H04N5/225; H04N5/335
Attorney, Agent or Firm:
Susumu Ito