To provide an imaging device, a defect correction apparatus, a defect correction method, and a program, which perform correction processing of image data with high accuracy.

The imaging device 1 includes a solid-state imaging element 3, a defect information memory 7 which stores, in advance, information relating to the types of defects of defective pixels and information relating to the defective levels of defective pixels, and a defect correction circuit 6 for correcting image data of defective pixels. The defect correction circuit 6 includes: a defect type determining section 52 for determining whether or not the defects of the defective pixels are first defects, second defects, or both first and second defects based on the information relating to the types of defects; a section 53 for determining whether the defects should be corrected, based on the comparison results obtained by comparing a correction determinant value obtained based on the output levels of the defective pixels and the information relating to the defective levels of defective pixels with a predetermined threshold value; and a pixel data correcting section 54 for correcting the image data of the defective pixels according to the determination results of the defect type determining section 52 and the section 53 for determining whether the defects should be corrected.