Title:
改良形試料検査システム
Document Type and Number:
Japanese Patent JP4499279
Kind Code:
B2
Abstract:
A curved mirrored surface (78) is used to collect radiation scattered by a sample surface (76a) and originating from a normal illumination beam (70) and an oblique illumination beam (90). The collected radiation is focused to a detector (80). Scattered radiation originating from the normal and oblique illumination beams may be distinguished by employing radiation at two different wavelengths, by intentionally introducing an offset between the spots illuminated by the two beams or by switching the normal and oblique illumination beams (70, 90) on and off alternately. Beam position error caused by change in sample height may be corrected by detecting specular reflection of an oblique illumination beam and changing the direction of illumination in response thereto. Butterfly-shaped spatial filters may be used in conjunction with curved mirror radiation collectors 78 to restrict detection to certain azimuthal angles.
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Inventors:
Stowskiy, Stanley
Application Number:
JP2000512065A
Publication Date:
July 07, 2010
Filing Date:
September 18, 1998
Export Citation:
Assignee:
KLA-Tenker Corporation
International Classes:
G01N21/956; G01J3/44; G01N21/00; G01N21/47; G01N21/88; G01N21/94; G01N21/95; H01L21/66; G01N21/21
Domestic Patent References:
| JP2512878B2 | ||||
| JP59006507B1 | ||||
| JP1028336B2 | ||||
| JP63101737A | ||||
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| JP7318500A | ||||
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Foreign References:
| WO1997012226A1 | ||||
| US5058982 |
Attorney, Agent or Firm:
Toshi Inoguchi