Title:
不純物検知装置及び不純物検知方法
Document Type and Number:
Japanese Patent JP7289248
Kind Code:
B2
Abstract:
To provide a device and method for detecting impurities, capable of evaluating the amount of metal elution from an ion exchanger in a lower concentration region and detecting the amount of impurity elution from the ion exchanger.SOLUTION: The device for detecting impurities, capable of detecting impurity elution from a first ion exchanger comprises: a water passing column including a region charged with the first ion exchanger and capable of passing water; a second ion exchanger arranged on the primary side of the region to the flow of the water; and analysis means arranged on the secondary side of the region to the flow of the water and for analyzing the impurity concentration of the water. The method for detecting impurities includes detecting impurity elution from the first ion exchanger using the device for detecting impurities.SELECTED DRAWING: Figure 1
Inventors:
Akihiko Tsuda
Hiroshi Sugawara
Hiroshi Sugawara
Application Number:
JP2019176940A
Publication Date:
June 09, 2023
Filing Date:
September 27, 2019
Export Citation:
Assignee:
Organo Co., Ltd.
International Classes:
B01J47/00; B01J39/05; B01J47/12; B01J49/06; B01J49/53
Domestic Patent References:
| JP2007256011A | ||||
| JP2009112944A |
Attorney, Agent or Firm:
Akio Miyazaki
Masaaki Ogata
Masaaki Ogata
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