To provide an in-circuit tester, which can prevent the contact defect of a circuit board with a probe pin due to the residue of flux on the circuit board, and which can prevent the damage of the circuit board due to the sliding abnormality of the probe pin.
The in-circuit tester has a flux local cleaning mechanism and a probe-pin load measuring mechanism. A nozzle raising and lowering unit 6 equipped with a mechanism, capable of being scanned and moved in the horizontal direction to a two-spindle drive unit 4 capable of running in the X-Y directions and a load-measuring-device raising and lowering unit 24 are arranged in the lower part of the circuit board 1 fixed to a circuit-board guide block 2; and by the contacting and continuity test of the circuit board 1 with the probe pin 5, a contact defect place is detected. After that, the unit 6 is moved to the contact defect place on the circuit board 1, a cleaning fluid is spurted from a nozzle 7, and the flux which is in the contact defect place on the circuit board 1 is removed.
MUTOU RIYOUJI
OMURA TOMOYUKI
ONO HIDEKI
HARIKAE KOUJIN
TAKANO NOBUHIDE
HORII TOMOHARU
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