Title:
INERTIAL MEASUREMENT DEVICE AND SELF-DIAGNOSTIC METHOD OF INERTIAL MEASUREMENT DEVICE
Document Type and Number:
Japanese Patent JP2023175165
Kind Code:
A
Abstract:
To provide an inertial measurement device for suppressing deterioration of accuracy in self-diagnosis, and also to provide a self-diagnostic method of the inertial measurement device.SOLUTION: An inertial measurement device includes: a first inertial sensor having a first detection axis; a second inertial sensor having a second detection axis defined as the opposite direction of the first detection axis; and a processing circuit for performing self-diagnosis based on whether a ratio of amplitude of an output of the first inertial sensor to amplitude of an output of the second inertial sensor is within a reference range.SELECTED DRAWING: Figure 8
Inventors:
SATO KENTA
Application Number:
JP2022087476A
Publication Date:
December 12, 2023
Filing Date:
May 30, 2022
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01P21/00; G01P15/10
Attorney, Agent or Firm:
Satoshi Nakai
Hiroki Matsuoka
Masayuki Imamura
Hiroki Matsuoka
Masayuki Imamura