Title:
INFRARED GAS ANALYZER AND CALIBRATION METHOD THEREOF
Document Type and Number:
Japanese Patent JP2022076765
Kind Code:
A
Abstract:
To provide an infrared gas analyzer capable of performing high-precision measurement at a low running cost.SOLUTION: An infrared gas analyzer 100 measures the concentration of a measurement target component in a sample gas based on the difference between an infrared absorption amount of the sample gas containing the measurement target component and an infrared absorption amount of a reference gas. The analyzer includes a measurement cell 10 in which the sample gas and the reference gas are alternately caused to flow at the time of measurement, a detector 14 that detects the absorption amounts of the sample gas and the reference gas irradiated with infrared rays in the measurement cell, and a control unit 21 that calculates the concentration of the sample gas based on an output of the detector. The reference gas is composed of a first reference gas and a second reference gas that do not contain the measurement target component. The analyzer further includes a first solenoid valve 40 that switches the flow of the sample gas to the measurement cell, a second solenoid valve 41 that switches the flow of the first reference gas, and a third solenoid valve 42 that switches the flow of the second reference gas. The control unit switches between the second solenoid valve and the third solenoid valve to perform zero point calibration.SELECTED DRAWING: Figure 1
Inventors:
OISHI MITSURU
Application Number:
JP2020187325A
Publication Date:
May 20, 2022
Filing Date:
November 10, 2020
Export Citation:
Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G01N21/61
Attorney, Agent or Firm:
Hiroyoshi Aoki
Masayuki Amada
Yoshimasa Okada
Masayuki Amada
Yoshimasa Okada