Title:
光増幅素子を搭載した検査チップ
Document Type and Number:
Japanese Patent JP4830110
Kind Code:
B2
Abstract:
The present invention provides an inspection chip using light, which is able to provide an irradiation of light at a high precision. The present invention further provides an inspection chip capable of carrying out the inspection of a sample in a simple manner by using a plurality of lights. The inspection chip of the present invention comprises a light amplifier element and a sample holding section for holding a sample, in which the light amplifier element is oriented so as to face to the sample holding section, so that the light emitted from the light amplifier element can irradiate the sample held in the sample holding section.
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Inventors:
Yuji Xing
Satoshi Kuhara
Satoshi Kuhara
Application Number:
JP2006514067A
Publication Date:
December 07, 2011
Filing Date:
May 23, 2005
Export Citation:
Assignee:
Kyushu University
International Classes:
G01N21/01; B01L3/00; G01N21/03; G01N21/11; G01N21/27; G01N21/41; G01N21/59; G01N21/64; G01N21/75; G01N37/00
Domestic Patent References:
| JP2004516190A | 2004-06-03 | |||
| JP2003177097A | 2003-06-27 | |||
| JP2004061222A | 2004-02-26 | |||
| JP2004150804A | 2004-05-27 | |||
| JP2004150803A | 2004-05-27 | |||
| JP2003515163A | 2003-04-22 |
Attorney, Agent or Firm:
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Yamazaki Kosaku
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Yamazaki Kosaku