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Patent Searching and Data


Title:
INSPECTION DEVICE OF DISPLAY PANEL AND ITS DEVICE
Document Type and Number:
Japanese Patent JP2009266687
Kind Code:
A
Abstract:

To provide an inspection method and an inspection device capable of highly accurately selecting a repairable display panel when inspecting a display panel, especially when inspecting an organic EL panel.

This inspection method includes a first receiving step S10 to receive current value data obtained by measuring a leak current of each pixel of the display panel by a measuring device, a second receiving step S20 to receive image data obtained by photographing the leak emission image of the display panel by a photographing device, a computing step S30 to compute the proportion of an area where leak emission is caused in the area of the pixel in each pixel, and a determination step S40 to determine whether the pixel is reparable or not repairable depending on whether the pixel is good or defective from the combination of the received leak current value and the computed proportion.


Inventors:
TAJIKA KENICHI
Application Number:
JP2008116068A
Publication Date:
November 12, 2009
Filing Date:
April 25, 2008
Export Citation:
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Assignee:
PANASONIC CORP
International Classes:
H05B33/10; H01L51/50
Attorney, Agent or Firm:
Hiromori Arai