To provide an inspection device for a phosphor formed on a display-panel backboard, for rapidly performing inspection on a substrate even when its kind is changed.
This inspection device for a display panel comprises a lighting means, an imaging means for mainly imaging rays of light reflected at an angle substantially equal to an incident-light incident angle among rays of light irradiated from the lighting means and reflected by liquid phosphor layers, a light reflection means for reflecting the rays of light, and a signal processing means. This device is characterized by measuring reflection light intensity for each of the phosphor layers while relatively moving the substrate, lighting means, imaging means, and reflection means, and measuring the filling amount of the plurality of phosphor layers applied to the substrate at prescribed intervals.
KURAMATA OSAMU
FUJII MICHIO
