Title:
検査治具及び接触子
Document Type and Number:
Japanese Patent JP5480075
Kind Code:
B2
Inventors:
Hideo Nishikawa
Application Number:
JP2010199545A
Publication Date:
April 23, 2014
Filing Date:
September 07, 2010
Export Citation:
Assignee:
Hideo Nishikawa
International Classes:
G01R1/067; G01R31/26
Domestic Patent References:
| JP3088866U | ||||
| JP2007194187A | ||||
| JP3154264U | ||||
| JP2009287921A | ||||
| JP2009047636A |
Foreign References:
| WO2000073805A1 |