PURPOSE: To save the RAM of a microcomputer used for writing test data in inspecting an integrated circuit constituting an electronic device by using a boundary scan method.
CONSTITUTION: A microcomputer COM stores test data input from an inspection device 5 through an external buss interface 3 in the data area in a RAM. And it sends the test data stored in the data area to an integrated circuit IC1, receives the data output in response to the test data transmission from an integrated circuit IC2, and stores it in the data area. The inspection device 5 inspects predetermined data among the data stored in the data area. As the inspection device sends a command to the microcomputer COM not to store in the data area, the other data than the predetermined data among the data received from the integrated circuit IC2, the RAM is saved.
OKUMOTO KOJI
SHIONO TORU
