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Patent Searching and Data


Title:
INSPECTION METHOD FOR ELECTRONIC EQUIPMENT
Document Type and Number:
Japanese Patent JPH03123940
Kind Code:
A
Abstract:

PURPOSE: To facilitate the inspection/diagnosis work of an electronic equipment by measuring time elapsed between the execution of a clock processing program and the execution of a preceding clock processing program with the execution of the program and comparing it with standard time.

CONSTITUTION: When the program is started, RAM 13, a display control part 14 and the other devices are sequentially checked. Time T1-T6 required for them are measured, and are stored in the prescribed area of RAM 13. Then, time T1-T6 and inspection/diagnosis data of addresses are displayed in the prescribed area of disk MD and the check result of respective devices is displayed in a display part 21 with time T1-T6. The inspection/diagnosis program is executed for the electronic unit which normally operates, a standard time is previously decided and it is compared with the measurement time T1-T6. When time T1-T6 is within a prescribed range as against respective standard times, it is judged to be good, and to be bad if it is beyond the range. Consequently, the inspection/diagnosis work of the electronic unit 1 is facilitated and a cause can be investigated with short labor hours.


Inventors:
KUWABARA TAKEO
Application Number:
JP26254489A
Publication Date:
May 27, 1991
Filing Date:
October 06, 1989
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G06F11/30; G06F11/22; (IPC1-7): G06F11/22; G06F11/30
Attorney, Agent or Firm:
Sadaichi Igita