Title:
INSPECTION METHOD, INSPECTION DEVICE AND MANUFACTURING METHOD OF OPTICAL MEMBER
Document Type and Number:
Japanese Patent JP2023142309
Kind Code:
A
Abstract:
To provide an inspection method and the like of an optical member which can determine an abnormality in a recess provided on one surface of an optical member for illumination device.SOLUTION: A method for inspecting an optical member 10 for illumination device having a recess 11 on one surface 10a comprises steps of: illuminating an inclined part 11a with light from an illumination part 1 which is arranged on an other surface 10b side of the optical member 10, is inclined in the same direction as the inclined part of the recess and has an optical axis 1A inclined at a prescribed inclination angle θ relative to the normal direction of the other surface, and generating a photographed image by imaging the light emitted to the inclined part and passing through the optical member with an imaging part 2 which is arranged on the one surface side and has a visual axis 2A along the normal direction of the one surface; and extracting a pixel region having a pixel value equal to or greater than a prescribed threshold in the photographed image by processing the photographed image and determining an abnormality in the recess on the basis of the magnitude of an area of the pixel region.SELECTED DRAWING: Figure 1
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Inventors:
SASAKI SHUNSUKE
Application Number:
JP2022049149A
Publication Date:
October 05, 2023
Filing Date:
March 24, 2022
Export Citation:
Assignee:
NITTO DENKO CORP
International Classes:
G01N21/958; G01N21/892
Attorney, Agent or Firm:
Patent Attorney Corporation Makoto International Patent Office