Title:
INSPECTION METHOD FOR SUBSTRATE FOR LIQUID CRYSTAL DISPLAY DEVICE AND LIQUID CRYSTAL DISPLAY DEVICE
Document Type and Number:
Japanese Patent JP2001337124
Kind Code:
A
Abstract:
To easily decide the presence of a short circuit and to provide high reliability.
A transparent stripe electrode 14x is extended to a terminal group 15b, to form an inspecting transparent electrode pattern 17. In the inspection for a transparent stripe electrode 14c and the transparent stripe electrode 14x existing between a terminal group 15a and the terminal group 15b, the presence of the short circuit is decided by applying voltage between a contact probe 19c and a contact probe 19x.
More Like This:
Inventors:
FUJITANI MASAYA
TSURUSAKI KOJI
TSURUSAKI KOJI
Application Number:
JP2000158833A
Publication Date:
December 07, 2001
Filing Date:
May 29, 2000
Export Citation:
Assignee:
KYOCERA CORP
International Classes:
G01R31/02; G02F1/13; G02F1/1343; G09F9/00; G09F9/30; (IPC1-7): G01R31/02; G02F1/13; G02F1/1343; G09F9/00; G09F9/30
Previous Patent: LOAD SIMULATOR FOR VOLTAGE-CONVERTING CIRCUIT
Next Patent: TESTER FOR SERIAL CONNECTION TYPE BATTERY
Next Patent: TESTER FOR SERIAL CONNECTION TYPE BATTERY