Title:
INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT SYSTEM, INSPECTION SUPPORT METHOD, AND INSPECTION SUPPORT PROGRAM
Document Type and Number:
Japanese Patent JP2020046843
Kind Code:
A
Abstract:
To perform support having high convenience during inspection.SOLUTION: An inspection support device 3 includes: a first recording part 32 for recording a table for registering inspection related information obtained by associating first unique information showing unique information for uniquely identifying an inspection place with first time information showing an inspection start time and an inspection end time of the inspection place; an operation reception part 34 for receiving a user operation; a specification part 31 for specifying second unique information showing unique information of an inspection place and second time information showing an inspection start time and an inspection end time of the inspection place in accordance with a user operation; a determination part 31 for determining whether the first unique information being the same as the second unique information is registered in the table with reference to the table; and a table management part 31 for updating the inspection related information by associating the second time information with the first unique information in the case that the determination part 31 determines that the first unique information being the same as the second unique information is registered in the table.SELECTED DRAWING: Figure 3
Inventors:
NARA KAZUTAKA
MORIGAMI HIROO
MORIGAMI HIROO
Application Number:
JP2018173849A
Publication Date:
March 26, 2020
Filing Date:
September 18, 2018
Export Citation:
Assignee:
FURUKAWA ELECTRIC CO LTD
International Classes:
G06Q10/00; G06Q50/08
Domestic Patent References:
| JP2011048673A | 2011-03-10 | |||
| JP2015125772A | 2015-07-06 | |||
| JP2017120545A | 2017-07-06 | |||
| JP2014130405A | 2014-07-10 | |||
| JP2011253469A | 2011-12-15 | |||
| JP2017157167A | 2017-09-07 |
Attorney, Agent or Firm:
Sakai International Patent Office