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Title:
検査支援装置、検査支援方法及びプログラム
Document Type and Number:
Japanese Patent JP6757690
Kind Code:
B2
Abstract:
An inspection support apparatus according to an aspect includes a memory and a processor connected to the memory, and the processor is configured to obtain three-dimensional data of the structure that includes a plurality of planes formed by the frame; from the three-dimensional data, detect a plurality of first planes that include at least three points of the three-dimensional data; for each of the detected first planes, compute, from the three-dimensional data, a number of three-dimensional points at a distance that is equal to or shorter than a prescribed distance from the first plane; and according to the computed number of three-dimensional points, identify, from the detected plurality of first planes, a second plane positioned on a forefront of the frame of the structure.

Inventors:
Kenji Inose
Naoyuki Akiyama
Naoki Morimoto
Hirohisa Hayakawa
Heiyang soldier
Toshikazu Taniguchi
Application Number:
JP2017069434A
Publication Date:
September 23, 2020
Filing Date:
March 31, 2017
Export Citation:
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Assignee:
Kashima Construction Co., Ltd.
International Classes:
G06T7/00; E04G21/18; G01B11/00
Domestic Patent References:
JP2017059861A
JP2017058274A
Attorney, Agent or Firm:
Goto Patent Office
Yoshiyuki Osuga
Hiroyoshi Aoki
Amada Masayuki