PURPOSE: To reduce the calculation quantity necessary for the searching of an inspection system.
CONSTITUTION: An analogue logical calculation part 1 calculates a logical value wherein a sequence circuit is approximated on the basis of a non-linear function and an evaluation value calculation part 5 calculates the evaluation value defined based on the linear sum of the evaluation corresponding to the difference between the output values of a normal circuit and a fault circuit and the evaluation variously enabling the transition of the normal circuit. An evaluation value partial differential coefficient calculation part 6 utilizes the partial differential coefficient to the input value of the calculated evaluation value and an inspection input setting part 10 performs the searching of inspection input maximizing the evaluation value at every time. From the properties of the evaluation value, the transition to a non-arrival state becomes possible at a searching time when the effect of a fault does not propagate to external output. Therefore, only by repeating searching at every time, a memory element can be set to a desired state. The time development of the sequence circuit is not required and, as a result, the increase of input searching space accompanied by the development of a time is prevented an calculation quantity can be reduced.
SHIMEKI TAIJI
KAYASHIMA KAZUHIRO
NIWA TOSHIO
SHIN SEIICHI
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