Title:
EXAMINATION SYSTEM AND EXAMINATION APPARATUS
Document Type and Number:
Japanese Patent JP2023072185
Kind Code:
A
Abstract:
To suppress overflow in transferring data.SOLUTION: An examination system includes a high-order unit and a low-order unit connected to the high-order unit. The high-order unit has a transmission part for transmitting a data file including write data requiring writing and a plurality of pieces of dummy data which do not require writing to the low-order unit. The low-order unit includes: a reception part for receiving the data file; a flash memory 241 for storing the data file; and a control part 242 which writes the write data of the data file in the flash memory 241 while the reception part receives the data file and does not write the dummy data of the data file in the flash memory 241.SELECTED DRAWING: Figure 3
Inventors:
ENDO TAKESHI
Application Number:
JP2021184565A
Publication Date:
May 24, 2023
Filing Date:
November 12, 2021
Export Citation:
Assignee:
NIHON DEMPA KOGYO CO
International Classes:
A61B8/00
Attorney, Agent or Firm:
Michihiro Izumi
Kyosuke Kutsune
Kensuke Terakawa
Kyosuke Kutsune
Kensuke Terakawa